Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films

Palacios-Lidón, E.; Guanter, Luis; Zúñiga-Pérez, J.; Muñoz-Sanjosé, V.; Colchero, J.

doi:10.1002/smll.200600469

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Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films

Palacios-Lidón, E., Guanter, L., Zúñiga-Pérez, J., Muñoz-Sanjosé, V., Colchero, J. (2007): Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films. - Small, 3, 3, 474-480.
https://doi.org/10.1002/smll.200600469

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Item Permalink: https://gfzpublic.gfz.de/pubman/item/item_237725 Version Permalink: https://gfzpublic.gfz.de/pubman/item/item_237725_3

Genre: Journal Article

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Palacios-Lidón, E.¹, Author
Guanter, Luis², Author
Zúñiga-Pérez, J.¹, Author
Muñoz-Sanjosé, V.¹, Author
Colchero, J.¹, Author

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1External Organizations, ou_persistent22
20 Pre-GFZ, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum, ou_146023

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DDC: 550 - Earth sciences

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Dates: Finally published : 2007

Publication Status: Finally published

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Identifiers: eDoc: 12138
DOI: 10.1002/smll.200600469

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Title: Small

Source Genre: Journal, SCI, Scopus, p3

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Pages: - Volume / Issue: 3 (3) Sequence Number: - Start / End Page: 474 - 480 Identifier: CoNE: https://gfzpublic.gfz.de/cone/journals/resource/1410222