Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films

Palacios-Lidón, E.; Guanter, Luis; Zúñiga-Pérez, J.; Muñoz-Sanjosé, V.; Colchero, J.

doi:10.1002/smll.200600469

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Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films

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Palacios-Lidón, E.
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Guanter, Luis
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Zúñiga-Pérez, J.
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Muñoz-Sanjosé, V.
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Colchero, J.
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Palacios-Lidón, E., Guanter, L., Zúñiga-Pérez, J., Muñoz-Sanjosé, V., Colchero, J. (2007): Nanogoniometry with Scanning Force Microscopy: A Model Study of CdTe Thin Films. - Small, 3, 3, 474-480.
https://doi.org/10.1002/smll.200600469

Cite as: https://gfzpublic.gfz.de/pubman/item/item_237725

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